Rafik Addou | Bridging Research and Manufacturing: The Role of Surface Science Nanometrology
•February 11, 2026
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Why It Matters
Understanding and controlling surfaces at the atomic level is essential for scaling next‑generation semiconductors and energy devices, directly impacting industry productivity and innovation.
Key Takeaways
- •Surface science bridges lab research and semiconductor manufacturing.
- •STM and XPS together reveal atomic structure and chemistry.
- •Interfaces dominate performance as device dimensions shrink to nanoscale.
- •Multi‑tool approach (microscopy, spectroscopy, diffraction) solves material puzzles.
- •UT‑Dallas cluster lab enables in‑situ deposition and analysis without exposure.
Summary
Dr. Rafik Addou, an assistant professor at UT‑Dallas, outlined how surface‑science nanometrology can close the gap between academic research and high‑volume manufacturing. Drawing on a diverse career across Morocco, France, Switzerland, the United States and Canada, he emphasized that surfaces and interfaces—not bulk material—govern the behavior of modern nano‑electronics, catalysts and batteries as devices shrink to the nanometer scale. He traced the evolution of surface science from early X‑ray diffraction to today’s scanning tunneling microscopy (STM) and X‑ray photoelectron spectroscopy (XPS), showing how each technique provides complementary insight into atomic structure, chemical composition and crystallographic order. Addou highlighted his “cluster lab” and a dedicated STM‑XPS system that allow in‑situ atomic‑layer deposition, sputtering, and analysis without breaking ultra‑high vacuum, enabling collaborations with industry leaders such as Intel, Texas Instruments and Micron. The integrated approach demonstrates that solving material challenges now requires a coordinated suite of microscopy, spectroscopy and diffraction tools, accelerating the translation of 2‑D material discoveries into manufacturable device components.
Original Description
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Rafik Addou | Bridging Research and Manufacturing: The Role of Surface Science Nanometrology
Abstract: Surface science metrology is crucial for analyzing and understanding interfaces that impact device performance and reliability. Accurate measurements of surface topography, chemistry, and interfacial properties help improve manufacturing processes and materials design. This presentation highlights how mastering surface and interface science enables scalable and reliable device fabrication from the lab to industrial production. Due to the surface complexity, combining complementary microscopy, spectroscopy, and diffraction techniques is crucial for a thorough analysis. In this talk, I will present examples where combining surface science techniques was essential for investigating and understanding advanced electronic and photonic devices, among others.
Bio: Dr. Rafik Addou is an Assistant Professor in the Department of Materials Science and Engineering at the University of Texas at Dallas (UTD). He has authored over 90 peer-reviewed publications, contributed two book chapters, and published a book titled " Defects in Two-Dimensional Materials." His current research focuses on low-dimensional materials for applications ranging from nanodevices to space coatings. His work is supported by DARPA, Texas Instruments, and UTD.
Website: https://labs.utdallas.edu/addou/
LinkedIn: https://www.linkedin.com/in/rafik-addou/
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Timecodes
00:00 Introduction and Welcome
00:58 Dr. Rafik Addou's Academic Journey
03:15 Importkance of Surfaces and Interfaces
10:00 Techniques for Studying Surfaces
16:24 Overview of Laboratory Tools and Techniques
22:49 Applications and Research Examples
25:59 Investigating Material Quality in 2D Transistors
26:49 Defects and Their Impact on Electronic Properties
28:28 Correlating Nanoscale and Microscale Measurements
30:47 Surface and Bulk Analysis Techniques
33:16 Impurities and Their Detection Limits
36:42 Collaborations and Case Studies
37:45 Graphene Growth and Characterization
42:19 Advanced Techniques and Recent Work
45:58 Q&A Session
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